Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Interferometric length and roughness measurements with nanometer accuracy level [4420-03]



    Kongress:

    Technical conference, Laser metrology for precision measurement and inspection in industry ; 1999 ; Florianopolis, Brazil



    Erscheinungsdatum :

    2001-01-01


    Format / Umfang :

    12 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Laser-based measurement to nanometer scale accuracy [4420-22]

    Jager, G. / Society for Optical Engineering / IMEKO - The International Measurement Confederation et al. | British Library Conference Proceedings | 2001


    Nr. 4420

    DataCite | 1930


    Interferometric method for in-situ characterization of coating industrial processes [4420-07]

    Michels, A. F. / Horowitz, F. / Society for Optical Engineering et al. | British Library Conference Proceedings | 2001


    User's guide to IR detectors [4420-09]

    Boreman, G. D. / Society for Optical Engineering / IMEKO - The International Measurement Confederation et al. | British Library Conference Proceedings | 2001


    Comparison between laser interferometric and calibrated artifacts for the geometric test of machine tools [4420-08]

    Sousa, A. R. / Schneider, C. A. / Society for Optical Engineering et al. | British Library Conference Proceedings | 2001