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    Titel :

    Robust spatial phase-stepping ESPI system [4420-17]



    Kongress:

    Technical conference, Laser metrology for precision measurement and inspection in industry ; 1999 ; Florianopolis, Brazil



    Erscheinungsdatum :

    2001-01-01


    Format / Umfang :

    6 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Application of endoscopic ESPI in NDI [4420-12]

    Hack, E. K. / Society for Optical Engineering / IMEKO - The International Measurement Confederation et al. | British Library Conference Proceedings | 2001


    Spatial phase-stepping using a computer-generated diffractive optical element [4420-19]

    Rodriguez-Vera, R. / Barrientos, B. / Moore, A. J. et al. | British Library Conference Proceedings | 2001


    Nr. 4420

    DataCite | 1930


    Portable residual stress measurement device using ESPI and a radial in-plane interferometer [4420-13]

    Albertazzi, A. / Kanda, C. / Borges, M. R. et al. | British Library Conference Proceedings | 2001


    Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge technique [4420-14]

    de Lemos, J. / Mischo, H. K. / Pfeifer, T. et al. | British Library Conference Proceedings | 2001