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    Titel :

    Enhancement of quantum efficiency of narrow-gap semiconductors infrared emission [4355-22]



    Kongress:

    International conference; 5th, Material science and material properties for infrared optoelectronics ; 2000 ; Kiev, Ukraine



    Erscheinungsdatum :

    01.01.2001


    Format / Umfang :

    6 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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    Kravetskii, M. Y. / Fomin, O. V. / SPIE- The International Society for Optical Engineering et al. | British Library Conference Proceedings | 2001


    Gap deep defect states in narrow-gap semiconductors [4355-29]

    Sizov, F. F. / Darchuk, S. D. / Golenkov, A. G. et al. | British Library Conference Proceedings | 2001


    Nr. 4355

    DataCite | 1929


    Hybrid and monolithic infrared detector arrays [4355-03]

    Van Hoof, C. A. / Zimmermann, L. / John, J. et al. | British Library Conference Proceedings | 2001


    Surface and oxide narrow-gap semiconductor interface Rutherford backscattering method [4355-24]

    Voitsekhovskii, A. V. / Lanskaya, O. G. / Lilenko, E. P. et al. | British Library Conference Proceedings | 2001