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    Titel :

    Digital speckle-interferometry camera for nondestructive testing (Invited Paper)



    Kongress:

    Symposium; 6th, Optoelectronics ; 1999 ; Bucharest



    Erscheinungsdatum :

    01.01.2000


    Format / Umfang :

    11 pages


    Anmerkungen:

    . Also known as SIOEL '99




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Optoelectronic developments in speckle interferometry (Invited Paper) [2860-22]

    Tatam, R. P. / SPIE | British Library Conference Proceedings | 1996


    Digital speckle correlation for nondestructive testing of corrosion [3572-57]

    Paiva, R. D. / Soga, D. / Muramatsu, M. et al. | British Library Conference Proceedings | 1999


    Digital speckle techniques applied to industrial precision measurements (Invited Paper) [3572-30]

    Torroba, R. D. / SPIE / Colombian Network of Optics | British Library Conference Proceedings | 1999



    Ultrahigh resolution interferometry (Invited Paper) [2861-18]

    Trolinger, J. D. / SPIE | British Library Conference Proceedings | 1996