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    Titel :

    Near Field Scanning Optical Microscopy Measurements of Optical Intensity Distributions in Semiconductor Channel Waveguide



    Kongress:

    Annual meeting; 9th, IEEE: Lasers and Electro-Optics Society; LEOS '96 ; 1996 ; Boston; MA



    Erscheinungsdatum :

    01.01.1996


    Format / Umfang :

    2 pages


    Anmerkungen:

    Described as proceedings. IEEE cat no: 96CH35895



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch





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