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    Titel :

    Analytical Predictions of Thermal Stress in MOSFETs



    Kongress:

    Aerospace applications conference ; 1995 ; Snowmass; CO



    Erscheinungsdatum :

    01.01.1995


    Format / Umfang :

    14 pages


    Anmerkungen:

    IEEE cat no 95TH8043; May be asked for as being held, Snowmass at Aspen, CO and being the 16th in this annual series of winter conferences



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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