Life tests of Nichia AlGaN/InGaN/GaN blue-light emitting diodes [2683-13]
Conference, Fabrication, testing, and reliability of semiconductor lasers ; 1996 ; San Jose; CA
1996-01-01
7 pages
Held as part of the SPIE OE/LASE '96 Symposium
Aufsatz (Konferenz)
Englisch
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