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    Titel :

    High-resolution IR laser spectral analysis in nondestructive onco-hematological diagnostics and semiconductor technique applications (Invited Paper) [2113-09]



    Kongress:

    International workshop, Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; 1993 ; Kiev



    Erscheinungsdatum :

    1994-01-01


    Format / Umfang :

    5 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Laser-thermal diagnostics of multilayer opto- and microelectronic structures (Invited Paper) [2113-29]

    Svechnikov, S. V. / Fedorenko, L. L. / Kaganovich, E. B. et al. | British Library Conference Proceedings | 1994


    Recharging of local centers and diagnostics of laser and nonlinear crystals (Invited Paper) [2113-28]

    Gorban, I. S. / Gumenjuk, A. F. / Kutovoy, S. Y. et al. | British Library Conference Proceedings | 1994


    Spectral diagnostics of microelectronic material surface structure with high spatial resolution [2113-05]

    Bobrovskaya, I. P. / Chepilko, A. G. / Levash, L. V. et al. | British Library Conference Proceedings | 1994


    Some aspects of thin-film ellipsometry (Invited Paper) [2113-02]

    Bortchagovsky, E. G. / SPIE | British Library Conference Proceedings | 1994