Some aspects of thin-film ellipsometry (Invited Paper) [2113-02]
International workshop, Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; 1993 ; Kiev
Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; 2113 ; 12-16
1994-01-01
5 pages
Aufsatz (Konferenz)
Englisch
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Compound material investigation by spectroscopic ellipsometry [2113-12]
British Library Conference Proceedings | 1994
|DataCite | 1886
British Library Conference Proceedings | 1994
|British Library Conference Proceedings | 1994
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