1–7 of 7 hits
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    Robustness Validation

    Kanert,W. / Preussger,A. / Infineon Technologies,DE | Automotive engineering | 2014

    Semiconductors in high temperature applications - a future trend in automotive industry

    Goroll, M. / Pufall, R. / Kanert, W. et al. | Tema Archive | 2004

    Reliability aspects of semiconductor devices in high temperature applications

    Kanert, W. / Dettmer, H. / Plikat, B. et al. | Tema Archive | 2003

    Simultaneous Analog Stimulation Pilot Pediatric Study

    Battmer, R. D. / Goldring, J. E. / Kanert, W. et al. | British Library Conference Proceedings | 2000