Synonyms were used for: Halbleiterbauelement
Search without synonyms: keywords:("Halbleiterbauelement")

1–20 of 52 hits
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    Zuverlaessigkeit am Beispiel der Flugzeugelektronik

    Pfaeuti, P. | Tema Archive | 1975
    Keywords: HALBLEITERBAUELEMENT

    Updating the Navy's parts derating requirements and application manual to include GaAs-based components

    Stuffle, B. / Harris, M. | Tema Archive | 1998
    Keywords: Halbleiterbauelement

    Ueber die Alterung von Silizium-Leistungstromrichtern

    Golubev, P.N. | Tema Archive | 1975
    Keywords: HALBLEITERBAUELEMENT

    The VMOS power device - A direct interface between microprocessors

    Blanchard, R. | Tema Archive | 1977
    Keywords: HALBLEITERBAUELEMENT

    The past, present and future of EEE components for space application; COTS-the next generation

    Wall, J. / Sinnadurai, N. | Tema Archive | 1998
    Keywords: Halbleiterbauelement

    The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers

    Cole, M.W. / Hubbard, C. / Demaree, D. et al. | Tema Archive | 1998
    Keywords: Halbleiterbauelement

    The easy way to get aerospace quality semiconductors

    Saddler, J. | Tema Archive | 1978
    Keywords: HALBLEITERBAUELEMENT

    Technologies and reliability of modern embedded flash cells

    Sikora, A. / Pesl, F.P. / Unger, W. et al. | Tema Archive | 2006
    Keywords: Halbleiterbauelement

    Strain depending reliability of automotive diodes

    Galateanu, L. / Stoica, M.G. / Popa, E. | Tema Archive | 1998
    Keywords: Halbleiterbauelement

    Semiconductors in high temperature applications - a future trend in automotive industry

    Goroll, M. / Pufall, R. / Kanert, W. et al. | Tema Archive | 2004
    Keywords: Halbleiterbauelement

    Reliable power electronics for automotive applications

    Seliger, N. / Wolfgang, E. / Lefranc, G. et al. | Tema Archive | 2002
    Keywords: Halbleiterbauelement

    Reliability screening through electrical testing for press-fit alternator power diode in automotive application

    Tan, Cher-Ming / Chiu, J. / Liu, R. et al. | Tema Archive | 2005
    Keywords: Halbleiterbauelement

    Reliability of thick Al wire bonds in IGBT modules for traction motor drives

    Onuki, J. / Koizumi, M. / Suwa, M. | Tema Archive | 2000
    Keywords: Halbleiterbauelement

    Reliability of MEMS - a methodical approach

    Muller-Fiedler, R. / Wagner, U. / Bernhard, W. | Tema Archive | 2002
    Keywords: Halbleiterbauelement

    Reliability of Au/Al bonding in plastic packages for high temperature (200 degrees C) and high current applications

    Passagrilli, C. / Gobbato, L. / Tiziani, R. | Tema Archive | 2002
    Keywords: Halbleiterbauelement

    Reliability engineering-an integrated approach at Daimler Chrysler

    Renner, J.H. | Tema Archive | 1999
    Keywords: Halbleiterbauelement

    Reliability assurance for optical semiconductor devices

    Iwane, G. / Nakano, Y. / Sudo, H. | Tema Archive | 1985
    Keywords: HALBLEITERBAUELEMENT

    Reliability aspects of semiconductor devices in high temperature applications

    Kanert, W. / Dettmer, H. / Plikat, B. et al. | Tema Archive | 2003
    Keywords: Halbleiterbauelement