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Laserinterferometrie
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Optimization of polishing parameters in computer-controlled optical polishing process [2861-46]
New type of common-path heterodyne profilometer [2861-40]
Multiaperture overlap-scanning technique for moire metrology [2861-16]
Investigation of speckle displacement effects on speckle interferometry [2860-47]
Infrared interferometer for optical testing [2860-24]
Laser optical strain sensor: technique and applications [2860-23]
Light-in-flight measurements by digital holography [2860-16]
Measurements of transonic shock structures using shearography [2861-19]
Design of a 24-in. phase-shifting Fizeau interferometer [2860-50]
Spatial domain method of DSPI fringe pattern recognition [2860-39]
Optical flat surfaces: subtraction of small-scale irregularities of the reference surface [2860-35]
Feedback type of laser diode interferometer with an optical fiber [2860-25]
Laser sizing of fine particulates [2861-43]
Measurement of the ac impedance of aluminum samples by holographic interferometry [2861-34]
Interferometric analysis of strained thin silicon films [2861-27]