1–20 of 560 hits
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    Development And Applications Of A Laser Writing Lithography System With Alignment Capability

    Feng-Lan Xu, / Chi-Yi Liaw, / Yuen-Chuen Chan, et al. | IEEE | 1997

    A vehicle electric power generation system with improved output power and efficiency

    Feng Liang / Miller, J.M. / Xu, Xingyu | Tema Archive | 1999

    Fast auto-focus approach based on green components analysis

    Feng, Huajun / Li, Qi / Xu, Zhi Hai | SPIE | 2002

    The influence of the vacuum annealing process on electrodeposited CuInSe2 films

    Xu, J.L. | Online Contents | 2002
    Contributors: Feng, J.Y.

    Micro-image processing system based on CMOS sensor

    Xu, Xiangdong / Li, Feng / Zeng, Chao et al. | SPIE | 2002

    Entangling two distant atoms by interference of polarized photons

    Xun-Li Feng, / Shang-Qing Gong, / Zhi-Zhan Xu, | IEEE | 2003

    Entangling two distant atoms by interference of polarized photons

    Feng, X.-L. / Gong, S.-Q. / Xu, Z.-Z. et al. | British Library Conference Proceedings | 2003

    USING THE CROSS-CORRELATION TECHNIQUE TO EXTRACT MODAL PARAMETERS ON RESPONSE-ONLY DATA

    Shen, F. | Online Contents | 2003
    Contributors: Feng Shi, D. , Xu, F.

    Auto-focus apparatus with digital signal processor

    Li, Qi / Feng, Huajun / Xu, Zhihai | SPIE | 2005

    A new technique for boosting efficiency of silicon solar cells

    Li, Jianming | Online Contents | 2005
    Contributors: Xu, Jiadong , Duan, Xiao-Feng , Wang, Feng-Lian

    Feature Selection for Image Categorization

    Xu, Feng / Zhang, Yu-Jin | Springer Verlag | 2006

    Estimating Illumination Parameters in Real Space with Application to Image Relighting

    Xie, Feng / Tao, Linmi / Xu, Guangyou et al. | Springer Verlag | 2006

    Analysis of RF Field in Open Cavity by Mode-Matching Technique

    Ying-hui, Liu / Li Hong-fu, / Li Hao, et al. | IEEE | 2006

    Nondestructive Testing of Paint Thickness Measurement by Pulsed Infrared Thermography

    Bo, Liu / Cun-lin, Zhang / Jing-ling, Shen et al. | IEEE | 2006