1–20 of 53 hits
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    State of charge estimation for electric vehicle batteries using unscented kalman filtering

    He, Wei / Williard, Nicholas / Chen, Chaochao et al. | Tema Archive | 2013

    A return on investment analysis of applying health monitoring to LED lighting systems

    Chang, Moon-Hwan / Sandborn, Peter / Pecht, Michael et al. | Tema Archive | 2015

    Effects of different test profiles of temperature cycling tests on the reliability of RFID tags

    Lahokallio, Sanna / Saarinen-Pulli, Kirsi / Frisk, Laura | Tema Archive | 2015

    Methodology of reliability enhancement for high power LED driver

    Lan, Song / Tan, Cher-Ming / Wu, Kevin | Tema Archive | 2014

    UV LEDs reliability tests for fluoro-sensing sensor application

    Arques-Orobon, F.J. / Nunez, N. / Vazquez, M. et al. | Tema Archive | 2014

    How supercapacitors reach end of life criteria during calendar life and power cycling tests

    Chaari, R. / Briat, O. / Deletage, J.Y. et al. | Tema Archive | 2011

    Analysis of ultracapacitors ageing in automotive application

    Catelani, M. / Ciani, L. / Marracci, M. et al. | Tema Archive | 2013

    Wafer-level LED-SiP based mobile flash module and characterization

    Lin, Jyh-Rong / Ng, Tuen-Yi / Wang, Zhaoxin et al. | Tema Archive | 2012

    A complete methodology for assessing GaN behaviour for military applications

    Moreau, C. / Le Pipec, M. / Tence, S. et al. | Tema Archive | 2010

    Electrical steering of vehicles - fault-tolerant analysis and design

    Blanke, M. / Thomsen, J.S. | Tema Archive | 2006

    Sequential environmental stresses tests qualification for automotive components

    Bahi, M.A. / Lecuyer, P. / Fremont, H. et al. | Tema Archive | 2007

    Reliability potential of epoxy based encapsulants for automotive applications

    Braun, T. / Becker, K.F. / Koch, M. et al. | Tema Archive | 2005

    Technologies and reliability of modern embedded flash cells

    Sikora, A. / Pesl, F.P. / Unger, W. et al. | Tema Archive | 2006

    Failure mechanisms and qualification testing of passive components

    Post, H.A. / Letullier, P. / Briolat, T. et al. | Tema Archive | 2005