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Synchrotron
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THz autocorrelation measurements at the Metrology Light Source
Development and application of aberration-compensating x-ray phase retarder systems [5195-11]
High selective x-ray multilayers [5195-08]
Laterally graded small d-spacing W/C multilayers (Abstract Only) [5195-22]
Influence of crystal surface roughness on the angular spread of x-ray diffracted beam [5195-18]
Dynamic focusing of polychromatic incident beam with bent crystals in Laue geometry [5195-02]
Spatially resolved tilt and strain measurements in diamond crystals [5195-24]
Focusing properties of x-ray polymer refractive lenses from SU-8 resist layer [5195-04]
Double gradient multilayers for broadband focusing [5195-01]
X-ray optics for 50-100 keV undulator radiation using crystals and refractive lenses [5195-10]
Double multilayer monochromator to tailor bending magnet radiation spectrum [5195-23]
Stability issues in the use of coherent x-rays [5195-16]