1–20 of 35 hits
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    Ultra high reliable spacecraft computer system design considerations

    Rayapati, V.N. / Mukedkhar, D. | Tema Archive | 1992

    Timing analysis of expedient voting and runahead

    Krishna, C.M. | Tema Archive | 1994

    Technologies and reliability of modern embedded flash cells

    Sikora, A. / Pesl, F.P. / Unger, W. et al. | Tema Archive | 2006

    Strain depending reliability of automotive diodes

    Galateanu, L. / Stoica, M.G. / Popa, E. | Tema Archive | 1998

    Semiconductors in high temperature applications - a future trend in automotive industry

    Goroll, M. / Pufall, R. / Kanert, W. et al. | Tema Archive | 2004

    Reliable power electronics for automotive applications

    Seliger, N. / Wolfgang, E. / Lefranc, G. et al. | Tema Archive | 2002

    Reliability potential of epoxy based encapsulants for automotive applications

    Braun, T. / Becker, K.F. / Koch, M. et al. | Tema Archive | 2005

    Reliability of MEMS - a methodical approach

    Muller-Fiedler, R. / Wagner, U. / Bernhard, W. | Tema Archive | 2002

    Reliability aspects of semiconductor devices in high temperature applications

    Kanert, W. / Dettmer, H. / Plikat, B. et al. | Tema Archive | 2003

    Reliability analysis of an automotive transmission system

    Kumar, P. / Gaindhar, J.L. | Tema Archive | 1996

    Part average analysis - A tool for reducing failure rates in automotive electronics

    Wagner, M. / Unger, W. / Wondrak, W. | Tema Archive | 2006

    On software standards

    Hughes, M.W. / Desoto, E.Y. / Sherif, Y.S. | Tema Archive | 1992

    On-chip reliability investigations on power modules actually working in inverter systems

    Franke, T. / Honsberg-Riedl, M. / Simon, P. et al. | Tema Archive | 1998

    Long term reliability testing of HV-IGBT modules in worst case traction operation

    Fratelli, L. / Cascone, B. / Giannini, G. et al. | Tema Archive | 1999