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Halbleiterbauelement
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Optical characterization in wide spectral range by a coherent spectrophotometer [5188-05]
Characterization of polarization aberrations in liquid crystal devices (Invited Paper) [5188-01]
New magnetic semiconductor sulfospinels with cobalt [5188-47]
Reliable determination of wavelength dependence of thin film refractive index [5188-25]
At-wavelength metrology on Sc-based multilayers for the UV and water window [5188-17]
Optimization of optical coatings for the UV/VUV range (Invited Paper) [5188-11]
InGaAs/GaAs Light Emittors for Optical Interconnections
Barrier-Doped GaAs/AlGaAs Quantum Well Detector
Carrier Recombination in Narrow Gap InAs/In~xGa~1~-~xSb Superlattices
InAsSb/InSb Strained-Layer Superlattice Infrared Detector Technology
Optical Gratings for GaAs/AlGaAs Quantum Well Detectors
Normal Incidence P-Type InGaAs/InGaAlAs Strained Quantum Well Infrared Photodetector
Localization of sub-100-nm particles on wafers with solid state detector arrays [5188-35]