Because electronic subsystems in modern defense systems are more complex than ever, the cost of automatic test equipment (ATE) that is used to ensure the reliability, functionality and design of a weapons system is now as much as 20 percent of the entire unit cost. The high cost has prompted money-saving measures in ATE purchases to reduce life-cycle costs of military programs. One of the results is the merger of custom, project-specific test sets developed for every new military project with commercial off-the-shelf gear that is modular enough to meet test requirements but still adheres to Department of Defense (DOD) specifications. The DOD purchases a large percentage of ATE, and commercial vendors have been obliged to adapt their general-purpose ATE systems to meet the strict and specific applications of the military services. ATE companies, therefore, are forced to re-examine the designs and open architectures needed to accommodate these stringent requirements.


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    Title :

    Adapting ATE to military requirements


    Additional title:

    Anpassung automatischer Pruefsysteme an militaerische Erfordernisse


    Contributors:
    Witts, D. (author) / Brock, D. (author)

    Published in:

    Defense Electronics ; 21 , 5 ; 74-82


    Publication date :

    1989


    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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