Digital automatic test program generators (DATPGs) are ideal for factory test because of their adeptness in responding to changing test requirements and unit-under-test (UUT) designs. Sanders Associates has used HITS (Hierarchical Integrated Test Simulator), the VAX-based US Navy-developed DATPG, on a low-cost Sanders-developed IBM-PC/AT-based test set. This test set was specifically designed for medium-complexity factory applications. High hardware and software maintainability is achieved by use of: 100% off-the-shelf components; and PC-DOS-residing Pascal-based software. The set's 192 I/Os can also handle bidirectional buses and various logic families. A description is given of the test set's hardware and software design, how HITS-generated test vectors are transferred to the test set, and how the test set is used in the factor environment. Overall, HITS is useful not only on high-speed, high-pin-depth test stations, but also on a low-cost, modest-capability test set that is well suited to many routine factory applications.


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    Title :

    A low cost approach to factory testing using HITS


    Additional title:

    Eine Low-cost-Loesung fuer die industrielle Anlagenueberpruefung auf der Grundlage eines hierarchisch integrierten Testsimulators


    Contributors:
    Morris, C. (author) / Mancini, J. (author)


    Publication date :

    1987


    Size :

    3 Seiten


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English