The authors collected a set of of heavy-ion single event upset test data since their last publications (ibid. vol.N5-32, no.6, p.4189, Dec. 1985). Earlier generalisations are extended to state-of-the art parts, and the statistical base for some of the previous parts classifications is expanded.
Recent trends in parts SEU susceptibility from heavy ions
Entwicklungstrends beim Haerten von integrierten Halbleiterschaltungen gegenueber schwerer Ionenstrahlung
IEEE Transactions on Nuclear Science ; NS-34 , 6, PT.1 ; 1332-1337
1987
6 Seiten, 2 Quellen
Article (Journal)
English
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