A sintered silicon carbide tile was characterized using high frequency ultrasound NDE in pulse-echo configuration. C-scan images of the bottom surface reflected signal amplitude revealed a number of high and low amplitude regions in addition to individual features. Scans of the sample's top surface reveal many of the amplitude features to be caused directly by scattering from surface scratches or roughness. In order to study the microstructural differences between high and low amplitude regions, a fast Fourier transform was taken of bottom surface reflections in order to graph the attenuation of the ultrasound as a function of frequency. The data suggests that the attenuation coefficient serves as a much better indicator of sample homogeneity than the unmodified amplitude of the bottom surface peak.
Role of microstructure in ultrasound response for armor ceramics
Die Rolle des Mikrogefüges bei der Ultraschallantwort von Panzerkeramik
2008
8 Seiten, 6 Bilder, 1 Tabelle, 8 Quellen
Conference paper
Storage medium
English
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