The authors have explored the better radiation tolerance of MOCVD grown, low bandgap, (0.95 eV) InGaAsP solar cells as compared to GaAs-on-Ge cells, after 1 MeV electron irradiation. The minority carrier injection due to forward bias and light illumination under low concentration ratio, can lead to enhanced recovery of radiation damage in InGaAsP n(+)-p junction solar cells. An injection anneal activation energy (0.58 eV) of the defects involved in damage/recovery of the InGaAsP solar cells has been estimated from the resultant recovery of the solar cell properties following minority carrier injection. The results suggest that low bandgap radiation resistant InGaAsP (0.95 eV) lattice matched to InP substrates provide an alternative to use as bottom cells in multijunction solar cells instead of less radiation resistant conventional GaAs based solar cells for space applications.


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    Title :

    Radiation hard InGaAsP solar cell for multijunction solar cells


    Additional title:

    Strahlungsbeständige InGaAsP-Solarzellen für Multiübergang-Solarzellen


    Contributors:
    Khan, A. (author) / Yamaguchi, M. (author) / Dharmarasu, N. (author) / Takashi, Y. (author) / Takagishi, S. (author) / Tanabe, T. (author) / Itoh, H. (author) / Ohshima, T. (author) / Imaizumi, M. (author) / Matsuda, S. (author)


    Publication date :

    2001


    Size :

    4 Seiten, 5 Bilder, 11 Quellen



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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