A plausible mechanistically based probability model for localized pitting corrosion and subsequent fatigue crack nucleation and growth is used to analyse tear-down inspection data from two retired B-707 aircraft that had been in commercial service for about 24 and 30 years. Sections of the left-hand lower wing skins from these aircraft had been previously disassembled and inspected optically at 20 x magnification. The inspections were augmented by metallographic examinations for the lower time aircraft. The evolution of damage in the fastener holes is estimated by using reasonable values for the localized corrosion and fatigue crack growth rates, statistically estimated from laboratory data. The primary loading, assumed to be the mean design load, is considered to be from ground-air-ground wing bending cycles, augmented by 'average' gust loading, only. The encouraging agreement between the estimated probability of occurrence and the observed distribution of multiple hole-wall cracks attests to the efficacy of the approach and its relevancy to airworthiness assessment and fleet life management.


    Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Probability modelling and statistical analysis of damage in the lower wing skins of two retired B-707 aircraft


    Contributors:
    Harlow, D.G. (author) / Wei, R.P. (author)


    Publication date :

    2001


    Size :

    13 Seiten, 13 Quellen




    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




    Milling aircraft wing skins

    Lloyd, T.E. | Engineering Index Backfile | 1949


    Systems and methods for assembling aircraft wing skins

    HANNINEN BRUCE J / LONG DANIEL T | European Patent Office | 2018

    Free access

    Buckling of Wing Skins

    Johnston, G. S. / Society of Allied Weight Engineers | British Library Conference Proceedings | 1994



    Optimization Of Composite Wing Skins

    Hakeem, S. A. / Indian Institute of Technology | British Library Conference Proceedings | 2000