The technology necessary to determine whether microcircuits will satisfy performance requirements for 10- to 15 year space missions is descussed large scale integration medium scale integration techniques are reviewed and the advantage of system reliability in keeping circuit complexity within a single silicon chip or wafer to function as an electronic system or subsystem is discussed redundancy. Radiation tolerant devices, and rigorous in-process control and screening tests are also discussed.


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    Title :

    Microcircuits, 10- to 15-year space missions


    Contributors:


    Publication date :

    1970


    Size :

    5 Seiten


    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    German