The authors study the low frequency noise of a forward biased dark solar cell as a nondestructive inspection test for solar panels. It is shown that by using this method one cell with a given defect can be detected in a solar panel under dark conditions. A real spacial solar panel consisting of five cells in parallel and five cells in series was tested. Cells for use in space are of the n+-p monocrystalline silicon junction type with an area of 8 cm2 and a base resistivity of 10 omega cm. The I-V, Rd=f(I) characteristics of one cell or of a panel are shown to be unchanged when a small defect is introduced by mechanical stress. Next, theoretical results on the 1/f noise in a p-n junction under forward bias are recalled. It is shown that the noise associated with the defective cell is about 10-15 times higher than that of a good cell. If one good cell is replaced by a defective cell in the 5*5 panel, this leads to an increase of about 30% in the noise level of the panel as a whole.


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    Title :

    Low frequency noise as a control test for spacial solar panels


    Additional title:

    Anwendung des niederfrequenten Rauschens fuer die zerstoerungsfreie Pruefung von Raumsonnenzellenanordnungen


    Contributors:
    Orsal, B. (author) / Alabedra, R. (author) / Ruas, R. (author)

    Published in:

    Solar Cells ; 18 , 1 ; 13-23


    Publication date :

    1986


    Size :

    11 Seiten, 6 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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