A test program was designed to evaluate various voltage-temperature (V-T) charge curves for use in low-Earth-orbit (LEO) applications of nickel-cadmium battery cells. The trends established relating V-T level to utilizable capacity were unexpected. The trends toward lower capacity at higher V-T levels were predominant in these tests. This effect was a function of the V-T level, the temperature, and the cell history. It was attributed to changes occurring in the positive plate. The results imply that for some application, the use of even lower V-T levels may be warranted. The need to limit overcharge, especially in the early phases of missions, in underlined by test program.


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    Title :

    Voltage-temperature charge verification testing of 34 ampere hour nickel-cadmium cells


    Additional title:

    Testprogramm fuer die Temperaturabhaengigkeit des Ladestroms von Nickel-Cadmium-Batterien fuer die Raumfahrttechnik


    Contributors:

    Published in:

    Journal of Power Sources ; 18 , 2-3 ; 197-208


    Publication date :

    1986


    Size :

    12 Seiten, 10 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English