A test program was designed to evaluate various voltage-temperature (V-T) charge curves for use in low-Earth-orbit (LEO) applications of nickel-cadmium battery cells. The trends established relating V-T level to utilizable capacity were unexpected. The trends toward lower capacity at higher V-T levels were predominant in these tests. This effect was a function of the V-T level, the temperature, and the cell history. It was attributed to changes occurring in the positive plate. The results imply that for some application, the use of even lower V-T levels may be warranted. The need to limit overcharge, especially in the early phases of missions, in underlined by test program.
Voltage-temperature charge verification testing of 34 ampere hour nickel-cadmium cells
Testprogramm fuer die Temperaturabhaengigkeit des Ladestroms von Nickel-Cadmium-Batterien fuer die Raumfahrttechnik
Journal of Power Sources ; 18 , 2-3 ; 197-208
1986
12 Seiten, 10 Quellen
Article (Journal)
English