Discusses the need for transient protection of semiconductors in automobile applications. Describes a semiconductor tester which simulates load dump, inductive switching, steady state noise, electronic ignition interference, and changing battery voltages which are encountered in an automobile. Programming is accomplished by front panel switches, meters, timers and controls.


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    Title :

    New tester simulates auto stresses on semiconductors


    Additional title:

    Neues Testgeraet simuliert Halbleiterbelastungen im Kraftfahrzeug


    Contributors:

    Published in:

    Evaluation Engineering ; 14 , 2 ; 22-23


    Publication date :

    1975


    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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