Abstract Models and methods in use for quantitative estimates of the occurrence of single event upsets in microchips of orbiting spacecraft are considered. A calculation and experimental technique for determining the rate of these effects is described, taking into account spatial and temporal distributions of the fluxes of high-energy particles in the space and their penetration through protective shields. Examples of its application for the orbit of the International Space Station are presented.


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    Title :

    The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft


    Contributors:

    Published in:

    Cosmic Research ; 43 , 6 ; 423-431


    Publication date :

    2005-11-01


    Size :

    9 pages




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English





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    PETERSEN, E. | AIAA | 1983