Abstract The results of radiation tests of microcontrollers of the ATmega-128 type in a wide range of dose rates and temperatures have been used to estimate the probability of no-failure operation of microcontrollers in real operating conditions. The Eyring function has been used to take into account the temperature effect.


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    Title :

    Predicting the No-Failure Microcontroller Operation Probability in a Geostationary Orbit


    Contributors:

    Published in:

    Publication date :

    2018




    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English



    Classification :

    BKL:    55.60 Raumfahrttechnik / 39.00 Astronomie: Allgemeines / 50.93 Weltraumforschung
    Local classification TIB:    770/3520/8000



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