Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Sub-pixel resolution for low-cost SMT component placement inspection systems


    Contributors:


    Publication date :

    1993



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    BKL:    53.36 Energiedirektumwandler, elektrische Energiespeicher
    Local classification TIB:    275/5670



    Elevator component inspection systems

    SUDI SANDEEP / TRIPP DANIEL M | European Patent Office | 2023

    Free access

    ELEVATOR COMPONENT INSPECTION SYSTEMS

    SUDI SANDEEP / TRIPP DANIEL M | European Patent Office | 2020

    Free access

    ELEVATOR COMPONENT INSPECTION SYSTEMS

    SUDI SANDEEP / TRIPP DANIEL M | European Patent Office | 2022

    Free access

    ELEVATOR COMPONENT INSPECTION SYSTEMS

    BEZAULT QUENTIN | European Patent Office | 2020

    Free access

    Elevator component inspection systems

    SUDI SANDEEP / TRIPP DANIEL M | European Patent Office | 2024

    Free access