The purpose of this testing was to examine the potential for destructive single event effects (SEE) in Broadcom’s ACPL-785E optocoupler in support of a NASA GSFC flight program. SEE testing was conducted NASA Space Radiation Laboratory (NSRL) at Brookhaven National Laboratory where devices with unmodified packaging were irradiated with high energy ions that have sufficient range to pass through the packaging of the device.
Single-Event Effect Testing of the Broadcom ACPL-785E Optocoupler
2020-12-19
Report
No indication
English
Broadcom - Security and Robustness
British Library Conference Proceedings | 2015
|NTRS | 1985
|100Gb/s PAM4 oxide VCSEL development progress at Broadcom
British Library Conference Proceedings | 2020
|Interview mit Scott McGregor, Broadcom: „Unsere Starke ist die Ausfuhrung„
British Library Online Contents | 2009