Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Qualification and reliability testing of a microchip laser system for space applications


    Contributors:
    Wright, M. W. (author) / Hemmati, H. (author) / Franzen, D. (author) / Sandor, M. (author)

    Conference:

    InterPACK 03 ASME Conference


    Publication date :

    2003-07-06


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English