Image-processing microdensitometer/Fourier analyzer yields statistics of subcomponent distribution. Nondestructive method for studying structure heterogeneous materials uses energy-dispersive X-ray analysis in scanning electron microscope. Scanning microdensitometer/Fourier analyzer (SMFA) is applied to SEM images to obtain statistics about sample structure. Method originally developed for studying effect on combustion of fine structure of composite solid propellants.


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    Title :

    Mapping the Structure of Heterogeneous Materials


    Contributors:

    Published in:

    Publication date :

    1986-05-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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