Test results are shown for a disdrometer breadboard which uses Mie scattering and incoherent optical correlation for in situ measurement of drop size distribution in a cloud chamber.


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    Title :

    Mie disdrometer for in situ measurement of drop size distributions


    Contributors:
    Loos, H. G. (author)


    Publication date :

    1979-01-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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