Outgassing, deposition, and desorption kinetics of silicone compounds, are examined as examples of optical surface contaminants of spacecraft windows. Their behavior in a space environment after exposure to ultraviolet radiation is also examined. The use of internal reflection spectroscopy is shown to provide a viable means of real-time, in-situ identification of contaminants of orbiting spacecraft. The instrumental techniques are proposed as the basis of further investigations and the development of flight hardware. (Author)
Results of an Analytical Study of Spacecraft Deposition Contamination by Internal Reflection Spectroscopy
1976
33 pages
Report
No indication
English
Astronautics , Physical & Theoretical Chemistry , Space debris , Spacecraft contamination , Spectroscopic analysis , Outgassing , Haze , Windows (Apertures) , Absorption spectra , Coatings , Condensates , Desorption , Optical properties , Silicones , Surface properties , Ultraviolet radiation , Internal reflection spectroscopy
Photo-enhanced spacecraft contamination deposition
AIAA | 1985
|Spacecraft contamination modeling
AIAA | 1977
|