We describe heavy ion test results for two new SEU tolerant latches based on transition nand gates, one for single rail asynchronous and the other for dual rail synchronous designs, implemented in AMI 0.5microprocess.


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    Title :

    SEU Performance of TAG Based Flip Flops


    Contributors:
    R. L. Shuler (author) / C. Kouba (author) / P. M. O'Neill (author)

    Publication date :

    2005


    Size :

    5 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English






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