Highly Accelerated Life Testing (HALT) testing holds promise for affordable efficient acceptance testing of multi-layer ceramic chip capacitors (MLCCs) especially for commercial off the shelf (COTS).


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    Title :

    NASA Electronic Parts and Packaging (NEPP) Program, Discussion of Highly Accelerated Life Testing (HALT) of Capacitors


    Contributors:
    K. A. LaBel (author) / M. J. Sampson (author)

    Publication date :

    2017


    Size :

    12 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




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