The flying test bed (FTB), developed for the purpose of studying the problems associated with hovering, vertical takeoff, and vertical landing of VTOL aircraft, was installed between two upright rails in a gantry of 9 m height and set on three 2 m stands. The permitted vertical movement was about 3.5 m. Running tests by remote control, ground operations tests by the crew, and climb and descent tests by the crew were carried out. The flight tasks given to two pilots were takeoff and landing, hover, climb, and descent by slow and step control. The height control test results showed that the height control systems, including the automatic stabilization equipment, have good speed-control-characteristics and sensitivity, although there was some backlash in the systems. The hovering characteristics were influenced by static friction between the FTB and rails, which assisted the pilot in achieving hover, but disturbed the pilot in leaving hover condition. (Author)


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Semi-Constrained Height Control Tests of Flying Test Bed for VTOL Aircraft


    Contributors:
    N. Takizawa (author) / Y. Miyamoto (author) / T. Kai (author) / Y. Tanabe (author) / A. Shibuya (author)

    Publication date :

    1974


    Size :

    64 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




    Hover Control Tests on Flying Test Bed for VTOL Aircraft

    N. Takizawa / H. Fujieda / K. Ono et al. | NTIS | 1975


    Height Control Test Equipment for VTOL Aircraft

    M. Matsuki / T. Torisaki / K. Nishio et al. | NTIS | 1972


    Flying-wing and VTOL flying-wing aircraft

    CHEN FRANKLIN Y K | European Patent Office | 2015

    Free access

    VTOL flying wing and flying wing aircraft

    CHEN FRANKLIN Y K | European Patent Office | 2022

    Free access

    Tailsitter VTOL flying wing aircraft attitude control

    Liang, Jianjian / Fei, Qing / Wang, Bo et al. | IEEE | 2016