In avionics application one of the most important competition factors is the reliability, given that the failure occurrence may leads to a critical state for the functioning of the aircraft. Some avionics apparatus are intolerant of failures, as lives may depend on the reliable functioning of equipment. Highly Accelerated Life Testing (HALT) is a time compression testing protocol that utilizes a step stress approach in subjecting products to varied thermal and vibration stresses. It is used to uncover design limitations and weaknesses in the preliminary design phase, helping designers to find and fix errors before they occur during the application in the field. The goal of HALT testing is to break the product by subjecting the test unit to progressively higher stress levels, incorporating thermal dwells, rapid temperature transitions, varied vibration stresses, and a combination of temperature and vibration to precipitate inherent defects. In this paper the HALT process related to an avionic equipment is described and a specific test plant is discussed.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Highly Accelerated Life Testing for avionics devices


    Contributors:


    Publication date :

    2014-05-01


    Size :

    350852 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Highly Accelerated Life Testing

    Parsons, David S. | NTRS | 2019


    Traction Inverter Highly Accelerated Life Testing With High-Temperature Stress

    Wu, Qunfang / Wang, Mengqi / Zhou, Weiyang et al. | IEEE | 2021


    Space shuttle avionics testing

    Taqvi, S.Z. | Tema Archive | 1977