An improved technique for measuring the refractive index profile of optical waveguides using a modified confocal scanning optical microscope with a stable light source, a low signal system, and a simple feedback scheme is described.


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    Title :

    Improved Reflection-Method for Refractive Index Measurements of Optical Waveguides


    Contributors:
    Youk, Y. (author) / Dug Young Kim, (author)


    Publication date :

    2005-01-01


    Size :

    231331 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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