Methods, systems, and apparatuses are provided for a Secondary Runway Aiming Point (SRAP) procedure of an approach by an ownship that includes identifying at least one aircraft making an approach that satisfy a set of preconditions to pair the aircraft to the ownship in the SRAP procedure; calculating a set of results based on lateral and vertical deviations of a paired SRAP aircraft to the ownship, and differential lateral and vertical rates of the paired SRAP aircraft to the ownship; deriving one or more points from the calculated set of results to determine whether in a flight path of the ownship there is an occurrence of an intrusion into a wake of the paired SRAP aircraft during the approach, and generating graphic data to present on the cockpit display the occurrence of the intrusion in the wake of the flight path of the ownship to the paired SRAP aircraft.


    Access

    Download


    Export, share and cite



    Title :

    Methods, systems, and apparatuses for identifying and indicating the secondary runway aiming point (SRAP) approach procedures


    Contributors:

    Publication date :

    2021-06-08


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    English


    Classification :

    IPC:    G01C Messen von Entfernungen, Höhen, Neigungen oder Richtungen , MEASURING DISTANCES, LEVELS OR BEARINGS / G08G Anlagen zur Steuerung, Regelung oder Überwachung des Verkehrs , TRAFFIC CONTROL SYSTEMS



    RUNWAY IDENTIFYING DEVICE AND RUNWAY IDENTIFYING METHOD

    FUJIWARA NAOHIRO / TERADA RYOTA / SANTO YUKI | European Patent Office | 2023

    Free access

    DEVICE FOR INDICATING RUNWAY BOUNDARY OF WATER AERODROME

    POTATUEV SERGEJ VASILEVICH | European Patent Office | 2016

    Free access

    Airfield runway sweeper capable of identifying airfield runway line

    CHU YUNBIN | European Patent Office | 2020

    Free access

    Movable Visual Aid For Indicating Temporary Closure of Runway

    AN YOUNG JIN / MUN JI HYEON / HWANG JU BIN et al. | European Patent Office | 2023

    Free access