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    Title :

    In-situ Raman spectroscopy : a method to study and control the growth of microcrystalline silicon for thin-film solar cells


    Contributors:


    Publication date :

    2012


    Size :

    X, 134 S.


    Remarks:

    240 mm x 170 mm
    graph. Darst.



    Type of media :

    Theses


    Type of material :

    Print


    Language :

    English



    Classification :

    DDC:    537.6226
    BKL:    33.68 Oberflächen, Dünne Schichten, Grenzflächen / 33.07 Spektroskopie / 53.36 Energiedirektumwandler, elektrische Energiespeicher