Two- and three-dimensional vision systems for inspection, control, and metrology II : 26 - 27 October 2004, Philadelphia, Pennsylvania, USA
Conference ; 2004 ; Philadelphia, Pa. Conference (Philadelphia, Pa.) : 2004.10.26-27
SPIE proceedings series ; 5606
2004
VII, 188 S
Ill., graph. Darst
Conference Proceedings
English
DDC: | 681.25 |