Light and elevated Temperature Induced Degradation (LeTID) of the carrier lifetime in multicrystalline silicon
2020
1 Online-Ressource (ix, 109 Seiten, 5248 KB)
Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek
Theses
Electronic Resource
German
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