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    Title :

    A New Method of Measuring Localized Chromatic Dispersion of Structured Nanowaveguide Devices Using White-Light Interferometry


    Contributors:
    Kim, D.W. (author) / Kim, S.H. (author) / Lee, S.H. (author) / Kim, K.H. (author) / Lee, J.-M. (author) / Lee, E.-H. (author)

    Published in:

    Publication date :

    2012-01-01


    Size :

    6 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692




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