MC5-56 Measurement of Loss Tangent of Dielectric ad Semiconductor Materials at Millimeter Waves and Temperatures 0.9-300K
30th, 13^t^h International Conference on Terahertz Electronics; International conference on infrared and millimeter waves; IRMMW-THz 2005 ; 2005 ; Williamsburg, VA
2005-01-01
2 pages
Includes bibliographical references and index
Conference paper
English
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