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    Title :

    Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces


    Contributors:

    Conference:

    European space components conference ; 2002 ; Toulouse, France



    Publication date :

    2002-01-01


    Size :

    6 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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