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    Title :

    AFM length analysis of data marks: measuring jitter, asymmetry, process noise, and process position [4342-72]



    Conference:

    Topical meeting; 17th, Optical data storage ; 2001 ; Santa Fe, NM



    Publication date :

    2002-01-01


    Size :

    9 pages


    Remarks:

    Also known as ODS2001




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 4342

    DataCite | 1928


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    Ishihara, K. / Kubo, H. / Yoshiyama, R. et al. | British Library Conference Proceedings | 2002


    Groove-only recording under DVR conditions [4342-48]

    Kuijper, M. / Ubbens, I. P. / Spruijt, L. et al. | British Library Conference Proceedings | 2002


    Performance evaluation of asymmetrical run-length-limited code for optical disks [4342-27]

    Kato, T. / Katayama, Y. / Yamakawa, H. et al. | British Library Conference Proceedings | 2002


    Electron beam mastering system for mass data storage [4342-113]

    Cartwright, G. / Reynolds, G. / Bayliss, C. et al. | British Library Conference Proceedings | 2002