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    Title :

    Evaluation of crystal lattice imperfections using reflection x-ray microscope [4501-11]



    Conference:

    Conference; 2nd, X-ray mirrors, crystals, and multilayers ; 2001 ; San Diego, CA



    Publication date :

    2001-01-01


    Size :

    7 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 4501

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