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    Title :

    New strategic challenges for instrumentation in precision laser metrology for industry [4420-11]



    Conference:

    Technical conference, Laser metrology for precision measurement and inspection in industry ; 1999 ; Florianopolis, Brazil



    Publication date :

    2001-01-01


    Size :

    8 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 4420

    DataCite | 1930


    Laser-based measurement to nanometer scale accuracy [4420-22]

    Jager, G. / Society for Optical Engineering / IMEKO - The International Measurement Confederation et al. | British Library Conference Proceedings | 2001


    User's guide to IR detectors [4420-09]

    Boreman, G. D. / Society for Optical Engineering / IMEKO - The International Measurement Confederation et al. | British Library Conference Proceedings | 2001


    High-precision measurement of cylinder form deviations with grazing incidence interferometry [4420-02]

    Weckenmann, A. / Kersting, T. / Schimke, W. et al. | British Library Conference Proceedings | 2001


    New generation of lasermike [4420-10]

    Jablonski, R. / Fotowicz, P. / Society for Optical Engineering et al. | British Library Conference Proceedings | 2001